Professor George Smith is a Emeritus Professor and past Head of the Materials Department at Oxford University. He widely considered to be the father of modern atom probe tomography (APT). Professor Smith's seminal contributions to developing APT have been internationally recognized by many honors and awards, including his election as a Fellow of the (British) Royal Society. However, Professor Smith's contributions extend far beyond APT, and include high quality and impact research on a remarkably diverse array of topics in materials science, ranging from characterization of nanoscale features in structural materials, to layered heterostructures in optoelectronic devices, to atomic scale observations of chemical reactions occurring on catalytic surfaces. After a brief review of atom probe history, and an update on its current status, Professor Smith will describe APT characterization of nanoscale features in structural alloys used in extreme environments; and phase separation, segregation, dopant distributions and solute clustering in InGaN heterostructures. Professor Smith will conclude his lecture by describing a vision for the future of APT. Host: Prof. Bob Odette